TY - JOUR
T1 - Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO3 ceramics co-doped with Nd and Ti
JO - Journal of Physics: Conference Series
PY - 2012/01/01
AU - Wang LQ
AU - Schaffer B
AU - MacLaren I
AU - Miao S
AU - Craven AJ
AU - Reaney IM
ED -
DO - DOI: 10.1088/1742-6596/371/1/012034
VL - 371
Y2 - 2025/07/28
ER -