TY - CONF T1 - Prediction of the Impact of Thermal Cycling on Machine Lifetime Based on Accelerated Life Testing and Finite Element Analysis JO - IECON 2021 鈥� 47th Annual Conference of the IEEE Industrial Electronics Society PY - 2021/10/13 AU - Hewitt D AU - Wang J ED - DO - DOI: 10.1109/iecon48115.2021.9589387 PB - IEEE Y2 - 2025/08/13 ER -