TY  - JOUR

T1  - Uncertainties of Data-driven Models: Theory and Application to Condition Monitoring

JO  - IEEE Transactions on Instrumentation and Measurement

UR  - https://doi.org/10.1109/tim.2025.3580883

PY  - 2025/06/18

AU  - Zhu Y-P

AU  - Liu Z

AU  - Lang ZQ

AU  - Laalej H

ED  - 

DO  - DOI: 10.1109/tim.2025.3580883

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SP  - 1

EP  - 1

Y2  - 2025/07/02

ER  -